Feb. 8 at 6:31 PM
💡 Semi Testing Watch
$COHU – Back-end test handlers & inspection systems. More cyclical, benefits from volume recovery in chips.
If this is helpful to you, tap @NasdaqKnight
$AEHR – Wafer-level burn-in testing. Plays silicon carbide & advanced node reliability, key for next-gen semis.
$FORM – Probe cards for wafer testing. Strong leverage to memory & HBM ramp, positioning well for high-performance compute demand.
These names are worth watching as chip production & test cycles accelerate.
